In-Circuit Test, Flying Probe, Boundary Scan and Functional Test Solutions.

Call Us at (410) 205-7300
The Test Connection, Inc., Testing Apparatus, Owings Mills, MD

ITAR Registered Test Development & Testing Center                          U.S. Army Veteran Owned & Managed        

  

Test Engineering Solutions

In-Circuit Test,    Flying Probe,    Boundary Scan,     Custom Functional Test,     DFT Review Services,

Contract  Test Services,    Engineering  Services,     Programming Tools,    LED Testing Tools

Tuesday, April 21, 2015

10AM - 4PM (Lunch will be provided)

11400 Cronridge Drive, Suite H, Owings Mills, Maryland, 21117

 

The Test Connection, Inc.  (TTCI) is hosting a manufacturing test seminar on how In-Circuit Test (ICT) has evolved from the 1980’s to the 2010’s with the erosion of access with the tradition bed of nails fixture.  Some of the technical topics we are looking to cover are;

  • Why Testing Matters (some surprising data).
  • The Effectiveness of Different Production Board Test Strategies.
  • How to Measure Test Coverage.
  • How New In-Circuit Test Systems have Expanded their Test Roles to Keep Pace with Manufacturing Test Challenges.
  • Removing Obstacles to Automating the Manufacturing Floor.
  • An Overview of Key ICT Technologies.
  • Limited Access Test Options including Flexible Boundary Scan and Functional Test Solutions.
  • Demos of Teradyne's TestStation Pro Software and Test Systems.

This seminar is targeting any manufacturing professional that deals with test engineering, process, and supply chain management or production test. 


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