In-Circuit Test, Flying Probe, Boundary Scan and Functional Test Solutions.

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ITAR Registered Test Development & Testing Center                          U.S. Army Veteran Owned & Managed        


Test Engineering Solutions

In-Circuit Test,    Flying Probe,    Boundary Scan,     Custom Functional Test,     DFT Review Services,

Contract  Test Services,    Engineering  Services,     Programming Tools,    LED Testing Tools

How to test an oversize board?


* Agilent Technologies Electronic Measurement business is now Keysight Technologies, new name same insight!

Our customers keep surprising us with challenges.

We recently had to develop an Keysight (Agilent) 3070 test program for a board with a shape that exceeded the size of a regular two-bank fixture. 

The UUT was a PCB strip that was also narrow and flexible with a relatively low node count so the solution was to test multiple strips on the same fixture and provide proper mechanical support for the thin strips.

Together with our fixture partner we decided to develop a fixture that extended over the regular size and still be safe for the operators to handle and use.

To see exact size check the video 

SMTA Capital Expo & Tech Forum!



Bill Horner, TTCI's President

 at our booth in Laurel, MD 


The Test Connection Inc. (TTCI) can save money and time for you with one of our professional services. Quality test engineering solutions with complete documentation allow our team to support needs from the earliest design stages to test development to testing of your product. 

Leading the Way in Electronic Test Engineering

TTCI has been supporting the electronics test arena for over three decades by offering printed circuit test solutions. Our services range from: In-Circuit Test (ICT) development and board testing services for Keysight (Agilent) 3070 and Teradyne (GenRad) TestStation/GR228X test systems, Flying Probe development and board testing services on our Digitaltest MTS500XL and Seica Pilot4D V8 flying probe test systems, Boundary Scan Test Solutions with the XJTAG and Keysight (Agilent) x1149 systems and Functional Test Solutions with the TS-5000 & TS-8900 PXI based systems and custom benchtop ATE.



July 2014 Newsletter



Release Date


 July 2014 Newsletter 07/07/2014
 May 2014 Newsletter 05/12/2014
 Open House Pilot V8  05/05/2014
 February 2014 Newsletter  02/20/2014
April 2013 Newsletter 04/16/2013

June 2012 GTTP Seminar



May 2012 Newsletter




March 2011 Newsletter




TTCI will be exhibiting at the SMTAI Show 2010 - Orlando FL



TTCI will be exhibiting at the IPC APEX Show 2010 - Las Vegas, NV


January 2010 Newsletter


How To Justify Flying Probe Testing, by Bill Horner



October 2009 Newsletter



January 2008 Newsletter



April 2007 Newsletter



January 2007 Newsletter



September 2006 Newsletter


August 2006 New Office



April 2004 Newsletter




Flying Probe Seminar March 2, 2004




July 2003 Newsletter




October 2002 Newsletter




June 2002 Newsletter




January 2002 Newsletter




April 2001 Newsletter