In-Circuit Test, Flying Probe, Boundary Scan and Functional Test Solutions.

Call Us at (410) 205-7300
The Test Connection, Inc., Testing Apparatus, Owings Mills, MD

ITAR Registered Test Development & Testing Center                          U.S. Army Veteran Owned & Managed        

  

Test Engineering Solutions

In-Circuit Test,    Flying Probe,    Boundary Scan,     Custom Functional Test,     DFT Review Services,

Contract  Test Services,    Engineering  Services,     Programming Tools,    LED Testing Tools

 

We've been tested!

 TTCI Case Study: Flying Probe versus ICT 

We've recently started our collaboration with a niche customer whose main area of expertise is the thin film interconnects. They challenged us to test a very special product, a high net count wafer.

Due to NDA restrictions we can't show images but we can tell you that there are over 15,000 test pads on a disc with a diameter of approximately 6".

We took the challenge - after all, a very special project takes a very special team with high-end equipment. 

We decided to use our Seica Pilot V8 to perform the required tests.

After a lot of preparation and careful setup we managed to perform the tests with high accuracy and repeatability.

It's our strong belief that technological progress can be made only by continuously pushing the boundaries of technology and by innovative thinking. 

We've performed a case study to help our customers identify when to decide for Flying Probe Testing or In-Circuit Testing based on the production volume.

Let's take a typical example: a regular PCB, with 700 nets, 950 electrical components, most of them SMD, with only 250 test pads and 500 vias (top and bottom), giving a total net coverage of 87%.

For the case described in this article, a production volume of 1317 boards represents the crossover point, below that quantity the flying probe testing becomes more efficient than in-circuit testing.

One might argue that the crossover point is artificially determined; that is correct.

It will move a little higher or lower depending on the prices and costs involved, but the conclusion of this article is that the flying probe testing is a much more time and cost efficient solution than the ICT if we are talking about low production volumes.

You can see the complete study here

The Test Connection Inc. (TTCI) can save money and time for you with one of our professional services. Quality test engineering solutions with complete documentation allow our team to support needs from the earliest design stages to test development to testing of your product. 

Leading the Way in Electronic Test Engineering

TTCI has been supporting the electronics test arena for over three decades by offering printed circuit test solutions. Our services range from: In-Circuit Test (ICT) development and board testing services for Keysight (Agilent) 3070 and Teradyne (GenRad) TestStation/GR228X test systems, Flying Probe development and board testing services on our Digitaltest MTS500XL and Seica Pilot4D V8 flying probe test systems, Boundary Scan Test Solutions with the XJTAG and Keysight (Agilent) x1149 systems and Functional Test Solutions with the TS-5000 & TS-8900 PXI based systems and custom benchtop ATE.

  

 

 

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Release Date

TTCi Case Study 09/10/2014
September 2014 Newsletter 09/17/2014
July 2014 Newsletter 07/07/2014
 May 2014 Newsletter 05/12/2014
Open House Pilot V8  05/05/2014
February 2014 Newsletter 02/20/2014
April 2013 Newsletter 04/16/2013

June 2012 GTTP Seminar

06/07/2012

May 2012 Newsletter

05/07/2012

March 2011 Newsletter

03/03/2011

TTCI will be exhibiting at the SMTAI Show 2010 - Orlando FL

08/31/2010

TTCI will be exhibiting at the IPC APEX Show 2010 - Las Vegas, NV

03/27/2010

January 2010 Newsletter

01/27/2010

How To Justify Flying Probe Testing, by Bill Horner

10/22/2009

October 2009 Newsletter

10/07/2002

January 2008 Newsletter

01/04/2008

April 2007 Newsletter

04/09/2007
January 2007 Newsletter

01/29/2007

September 2006 Newsletter

09/2006

August 2006 New Office

08/2006

April 2004 Newsletter

04/23/2004

Flying Probe Seminar March 2, 2004

02/10/2004

July 2003 Newsletter

07/23/2003

October 2002 Newsletter

10/07/2002

June 2002 Newsletter

06/17/2002

January 2002 Newsletter

01/29/2002

April 2001 Newsletter

04/02/2001